2027 Call for Abstracts Opens Soon

Metrology at SEMICON West 2027

TOPICS:

  • Precise assay measurement for multicomponent formulated cleans, CMP Slurries
  • Measurement of Airborne Molecular Contamination (AMC)
  • Analysis of trace metals in deposition materials and liquid chemicals
  • Analysis of trace metals in corrosive gases
  • Measurement of Organics on wafer surface and nanoparticles
  • New analytical methods and instrumentation
     

IMPORTANT INFORMATION & 2027 DEADLINES
 

Deadlines

Information

Sept 30

Call for Abstracts Open

Nov 23

Abstract Submissions Deadline

Jan 8

Author and Speaker Notification

Mar 15

Speaker Portal Tasks Due

  Mar 15  

  Final PPT Due (16:9 display format) and PDF Versions  

 

QUESTIONS?

Contact Laura Nguyen
[email protected]

 

SPEAKER REQUIREMENTS

If your abstract is accepted and you are invited to present, please complete these requests:

  • Speaker agreement
  • Headshot and short bio (<500 words)
  • PowerPoint slide presentation (16:9 format)
  • PDF for distribution to attendees
  • Identify a replacement speaker if unable to attend