Call for Abstracts for Speakers + Posters
Test Vision Symposium at SEMICON West 2025
Test: Advancing Together with Innovation
TOPIC AREAS
- Power / Power Delivery:
- Co-packaging Power Processes (modules)
- Wide Bandgap (SiC , GaN) Test
- Isolation and High Voltage Test
- Power Test and Power Test Methods
- Battery Management Systems (BMS) Test
- PMIC and Power Stage Test
- Digital Test:
- Leading Edge Process Nodes
- Advanced Packaging & Chiplets
- Testing AI
- Advanced Scan
- Security
- Test Infrastructure:
- Wafer-level Burn-in
- Panel Testing
- Handling High Current in Test (Sockets, Needles, PCBs)
- Pushing the Density of Probe Arrays
- Advanced Handling (Robotization, High-Multi Site)
- Using AI in Testing
- Data Management and Data Analytics
- Active Thermals
- EDA-to-ATE
- Diagnostic Tools
- Real-time Analytics & Control
- Traceability and Security
- Interfaces & Sensors:
- PCIe, UCIe, MIPI, etc.
- Sensors & Transducers (Humidity, Pressure, etc.)
- Photonics ICs & Interconnects
- RF (mmWave, radar, UWB, WiFi, 6G)
- Image Sensors
- MicroLED / OLED
- Test Trends:
- On-Die Test Agents (BIST, I-JTAG, Cache Resident Test)
- System Level Test
- Supporting Co-simulation
- Post-Silicon Validation
- Productivity Improvements (Tools)
- Standardized Test Language
- High Reliability ICs (Automotive, Healthcare, Consumer)
- Impact on On-shoring
- Test 2.0
IMPORTANT INFORMATION & DEADLINES
Deadlines | Information |
March 10 | Call for Abstracts Open |
June 30 | Abstract Submissions Deadline |
July 7 | Author and Speaker Notification |
July 7 | Speaker Portal Tasks Due |
September 8 | Draft Presentation for Review |
September 22 | Final PPT Due (16:9 display format) and PDF Versions |
QUESTIONS?
Basak Ulutas Ozturkler
[email protected]
SPEAKER REQUIREMENTS
If your abstract is accepted and you are invited to present, please complete these requests:
- Speaker agreement
- Headshot and short bio (<500 words)
- Identify a replacement speaker if unable to attend