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[LIVE] Expanding the Role of Test - Automotive Session

Thursday, July 23 | 9:00 am - 10:00 am

“Moore’s Law” and “More than Moore” packaging advancements still guide our roadmaps as the race for denser, larger, faster and highly heterogeneous devices continues. Now, add the near-instantaneous time-to-market imperatives and the new challenges of 7nm processes and beyond, and the test complexities intensify. This calls for new innovations in DFT, test methodologies, wafer probing technology, and device manufacturing - to build valuable solutions for test IP and equipment developers, as well as tool providers and users. So, at Test Vision Symposium, we’ll ask questions like this: What can we do differently to provide testing cost-effectively with dppm rates approaching zero? What R&D tools are needed for today’s and tomorrow’s devices? What will test cell (ATE, fixtures, handlers, or probers and probe cards) need to look like in 2020 and beyond? How can test be better integrated into the manufacturing process? Are today’s technologies adequate for the future? If not, what can we do to close the gap?

Agenda

Unique Solution to Probe Constraints for High Current Limit Testing at Probe

Alex Saenz

Texas Instruments
9:00 am - 9:30 am