Test Vision CFP—Share Your Expertise!
Test Vision is today's premier workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly-anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. The conference typically has 100+ participants and is held in conjunction with SEMICON West, assuring access to a wide range of expertise and experience. This year’s theme is “Expanding the Role of Test.”
The growth in autonomous driving and the connected “everything” is driving the demand for semiconductors. This trend is putting more pressure on test costs as a result of higher coverage requirements or lower average selling prices. Test must become even more intelligent to address the increased quality demands, while at the same time remaining economical. Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher performance analog, and increasing RF complexity. To address those challenges, all the tools in the arsenal must be brought to bear; increasing test instrumentation integration, smarter test strategies, self-test, adaptive test, system level test, and more sophisticated test hardware.
Fresh Perspectives Wanted
With these topics as the backdrop, we intend to spark lively debate. This means picking apart the overall device production process and examining how test could in fact become its ultimate “enabler.” To this end, we’re seeking papers that offer thought-provoking and even controversial ideas. We especially encourage contributions from individuals that have spent time in the “test trenches."
“Moore’s Law” and “More than Moore” packaging advancements still guide our roadmaps as the race for denser, larger, faster and highly heterogeneous devices continues. Now, add the near-instantaneous time-to-market imperatives and the new challenges of 7nm processes and beyond, and the test complexities intensify. This calls for new innovations in DFT, test methodologies, wafer probing technology and device manufacturing - to build valuable solutions for test IP and equipment developers, as well as tool providers and users.
So, at Test Vision Symposium, we’ll ask questions like this: What can we do differently to provide testing cost effectively with dppm rates approaching zero? What R&D tools are needed for today’s and tomorrow’s devices? What will test cell (ATE, fixtures, handlers or probers and probe cards) need to look like in 2020 and beyond? How can test be better integrated in to the manufacturing process? Are today’s technologies adequate for the future? If not, what can we do to close the gap?
Representative Topics Include but Not Limited To:
- New market drivers and future trends
- 5G New Radio and mmWave
- Ultra Wide Band
- Medical applications
- Battery management
- Automotive ADAS, LiDAR and radar
- Automotive EV components
- 3D sensors
- Silicon photonics
- Optoelectronic foundry
- IoT for consumer, automotive, healthcare
- System level integration
- New packaging technologies
- System in Package
- Industry 4.0 / Smart Manufacturing
- Data management and data analytics
- Data across the semiconductor supply chain
- Design to test innovation
- Artificial intelligence (AI)
- Quantum computing
- Test data driven yield improvement
- Defect detection and stress
Call for Posters
Owing to its continuing success, we will again include a Poster Session during the Symposium. We encourage participation by seasoned test experts, as well as students, post-docs, and others with interesting observations to share on how your test process has adapted to the ever-changing realities of test.
Important Information and Deadlines | Test Vision Symposium CFP
- June 1: Call for Paper and Poster Submissions Due
- June 15: Author/Speaker and Poster Notification
- June 29: Draft Presentation Due for Committee Review
- July 6: Final PPT Presentation (16:9 display format) and PDF Versions Due
- July 21-23: Paper and Poster Presentation Dates for Test Vision Symposium (session time slot to be assigned)