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Lunch Break and Test Vision Poster Session

Moscone North Room 20 Wednesday, July 10
12:05pm to 1:15pm

Poster Session Presenters:

Lattice Imaging and Defect Analysis of Semiconductors by Terahertz Imaging Overcoming the Abbe DL
Anis Rahman, Chief Technology Officer, Applied Research & Photonics
 

Preparing for Industry 4.0 with RITdb & TEMS
Brian Bogie, Senior Director Product Marketing, Cohu
 

SEMI Standards Guiding Smart Supply Chain Traceability
Inna Skvortsova; Sr. Coordinator, International Standards; SEMI
 

New Standard for Device Traceability Enabling Smart Supply Chain
Inna Skvortsova; Sr. Coordinator, International Standards; SEMI
 

Wave Front Phase Imaging - High Speed Wafer Geometry Measurement
Jan Gaudestad, Sr. Director of Business Development, Wooptix
 

How we Could Realize Faster Market Launch the Devices Especially for Consumer Products
Kotaro Hasegawa, System Planning Senior Director, Advantest
 

Tester Event Messaging for Semiconductors (TEMS) Standard - Overview & Status
Laurent Bonneval, Production Integration Engineer, Teradyne
 

SEMI Standards and CAST
Mark Roos, CEO, Roos Instrument
 

Rich Interactive Test Database (RITdb) Standard - Overview & Status
Stacy Ajouri, Systems Integration Engineer, Texas Instruments
 

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