Test Vision is today's premier 2-day workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly-anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. The conference typically has 100+ participants and is held in conjunction with SEMICON West, assuring access to a wide range of expertise and experience. This year’s theme is “Ground Breaking Innovations in Test”
The growth in autonomous driving and the connected “everything” is driving the demand for semiconductors. This trend is putting more pressure on test costs as a result of higher coverage requirements or lower average selling prices. Test must become even smarter to address the increased quality demands, while at the same time remaining economical. Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher performance analog, and increasing RF complexity. To address those challenges, all the tools in the arsenal must be brought to bear; increasing test instrumentation integration, smarter test strategies, self-test, adaptive test, system level test, and more sophisticated test hardware.