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TechTALK: Materials Session — Reducing Risk for Customers

TechTALKS Stage North Tuesday, July 09
2:00pm to 4:00pm

With the increasing complexity of IC architecture, and the continuing evolution towards the need to control each circuit component down to the molecular level, it is becoming essential to define new and/or updated ways to detect, measure and eliminate sources of contamination, ultimately reducing risks and costs for IDM’s. Key topics will include role of particles, impurities and associated analysis, as well as a panel session, allowing attendees to provide direct inquires on all topics.

Do you want to attend this session? Register for SEMICON West.

Pratik Joshi
Staff Engineer II, Defect Engineering Department
Samsung Semiconductor
Pratik Joshi
Staff Engineer II, Defect Engineering Department
Samsung Semiconductor
Preston Williamson
Manager, Business Development Group
Entegris
Ming Feng Li
Senior Marketing Director
KLA Corporation
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