Automated Test Equipment (ATE) Meetings

Monday, July 08
8:00am to 11:30am

The Global Automated Test Equipment (ATE) Technical Committee explores, evaluates and formulates consensus-based specifications that through voluntary compliance will enhance the manufacturing capability of the semiconductor industry as it relates to test and its associated environment.

Rich Interactive Database (RITdb) Task Force
Monday, July 8 | 8:00-10:00am

Tester Event Messaging for Semiconductors (TEMS) Task Force
Monday, July 8 | 10:00-11:30am

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