Michael F. Pas received his Ph.D. degree in 1989 from Texas A&M University in Physical Chemistry. He completed a Post Doc at the Center for Numerical Intensive Computing at IBM Kingston, NY in 1991. He joined Texas Instruments Inc. in 1991. He has held a variety of engineering and management positions at TI. He currently is the ATE Test Manager in the Test Technology and Product Engineering Group. He has published over 35 papers in MRS, ECS and IEEE journals. He holds 19 US patents.