Dr. Joshi is the CTO and Founder of Active Layer Parametrics (ALP), Inc. a company developing an atomic resolution electrical profiling technology called the ALPro(TM) technique. Dr. Joshi developed many aspects of the ALPro system/technology. Dr. Joshi's expertise includes system integration, semiconductor processing, device physics, robotics and laser devices. He has over 30 publications, mostly on semiconductor characterization approaches. Dr. Joshi’s previous start-up, TheiaScientific Corp., developed microelectromechanical systems (MEMS) for materials characterization.