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Test Vision Symposium: Ground Breaking Innovations in Test (Day 1)

Moscone North, Room 21 Wednesday, July 10
9:00am to 5:00pm

SEE THE AGENDA

Test Vision is today's premier 2-day workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly-anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. The conference typically has 100+ participants and is held in conjunction with SEMICON West, assuring access to a wide range of expertise and experience. This year’s theme is “Ground Breaking Innovations in Test”

The growth in autonomous driving and the connected “everything” is driving the demand for semiconductors. This trend is putting more pressure on test costs as a result of higher coverage requirements or lower average selling prices. Test must become even smarter to address the increased quality demands, while at the same time remaining economical. Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher performance analog, and increasing RF complexity. To address those challenges, all the tools in the arsenal must be brought to bear; increasing test instrumentation integration, smarter test strategies, self-test, adaptive test, system level test, and more sophisticated test hardware.

Industry Sponsors:

         

Co-Sponsored by: 

Do you want to attend this session? Register for SEMICON West.

Heath Noxon
Semiconductor Market Development Manager
National Instruments
Jan Gaudestad
Sr Director of Business Development
1975
Kotaro Hasegawa
System Planning Senior Director
Advantest
Matthias Hoeh, PhD
Business Development Manager
Electro Optical Systems GmbH
Anis Rahman
Chief Technology Officer
Applied Research & Photonics
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