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TechTALK: Component Quality & Traceability in Microelectronics Manufacturing

TechTALKS Stage North Tuesday, July 09
10:30am to 12:30pm

There is a great sense of urgency in preparing the supply chain to enable HVM at advanced nodes. Industry standards on how defects are measured on various components and sub-components and on how these results are reported are severely lacking. This is especially alarming when several yield excursions are linked to a wide range of component- and subcomponent-induced defectivity. Furthermore, current component and subcomponent defect traceability lack the rigor for advanced technologies, particularly with regard to detectability, sensitivity, and methodology. This session will highlight the need for standard quality assurance measurements for critical equipment parts, subsystems and consummables.  Thought leaders will share perspectives on critical areas where the supply chain stakeholders can collectively collaborate to address these quality assurance gaps.

Do you want to attend this session? Register for SEMICON West.

G.Dan Hutcheson
CEO and Chairman
VLSI Research and weSRCH.com
Kevin Chasey
Senior VP and Deputy GM
TEL America
Patrick Martin
Head of Field Technology Transistor and Interconnect
Applied Materials
Sanchali Bhattacharjee
Engineering Manager, Global Supply Management
Intel
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