The amount of electronic content in passenger cars continues to grow rapidly, driven largely by the integration of various ADAS and autonomous driving capabilities. Recent reports indicate that hundreds of semiconductor devices are now being integrated into higher-end vehicles. What’s more, these components are becoming increasingly complex. The frontier for sophisticated semiconductors is in fact being led by the chips needed to execute artificial intelligence algorithms that govern emerging self-driving capabilities. It is of course critical that these safety-related devices adhere to the highest possible quality and reliability requirements. Meeting the functional safety requirements mandated by the ISO 26262 standard requires the integration of advanced self-test and monitoring capabilities throughout the vehicle’s electronics. The capabilities must not only have the ability to fully test all electronics during power-up, but more importantly must provide the ability to perform periodic tests throughout the functional operation of the vehicle. These requirements result in many challenges including meeting necessary fault coverage metrics, maintaining periodic testing without adversely affecting the performance of the vehicle and achieving a system-wide test strategy that is compatible with a wide range of system architectures. A new generation of self-test IP and related design automation are being developed to address these evolving challenges.