ITRS CrossCut Technologies

Thursday, July 11, 2013
2:00pm-3:30pm
Extreme Electronics Stage, South Hall

 


The ITRS is undergoing a major change this year to reflect the market evolution towards highly mobile flexible devices that allow the users to highly customize them to their liking. As a result he new 2013 ITRS will span from Equivalent Scaling to Customized Functionality. These ITRS working groups will present their 2012 roadmap topics that are pervasive throughout the industry, such as green chemistry, sustainability issues, and the future requirements of factory and materials sciences as the industry progresses to the next generation of semiconductors and their applications.  In addition, disciplines of metrology and yield enhancement supporting the above fields of research round out the presentations and panel discussions.

Presentations include factory integration, environment, safety, and health (ESH), metrology, yield enhancement, and emerging research materials (ERM).

 

2:00pm-2:05pm
    
Greeting from the ITRS IRC Chair

IRC Session Chair

 
2:05pm-2:20pm

Overall Roadmap Technology Characteristics (ORTC)

IRC Member from USA- Alan Allan

 
2:20pm-2:35pm Factory Integration

James Moyne

 
2:35pm-2:50pm Environment, Safety and Health

Leo Kenny

   
2:50pm-3:05pm Metrology
Alain Diebold
   
3;05pm-3:20pm Yield Enhancement

Lothar Pfitzner

   
3:20pm-3:25pm Q&A
 
3:25pm-3:30pm Closing Remarks

IRC Session Chair

 

 

 

Session presented in cooperation with 

 

 

Please check back frequently for updates and more information as agendas develop and speakers are announced.


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