Test Vision 2020 | SEMICON West

Test Vision 2020
July 10-11, 2013

San Francisco Marriott Marquis

Golden Gate Ballroom A, Golden Gate Level

Co-sponsored by:

Test Vision 2020, formerly ATE Vision, has emerged as the premier workshop in the area of Automated Test Equipment. Attracting record attendance from a broad cross-section of the semiconductor community, the workshop features a compelling line-up of papers, keynotes and panel participation from leaders in the industry.

This year, once again the workshop will be held with SEMICON West and will examine where the test industry is heading and provide a forum for discussing the directions and solutions for emerging problems.

Agenda

July 10, 2013

3:00pm-3:30pm		Registration

3:30pm-3:45pm		Welcome Remarks Ajay Khoche, General Chair KEYNOTE: Product Foundry: Next Paradigm in Product Design and Engineering Erik Volkerink, Ph.D Chief Technology Officer, Flextronics

4:30pm-4:45pm		Break

4:45pm-6:00pm		Panel 1: How Much Test Is Enough Test? Session Chair: Ken Lanier (Teradyne)
		Moderator: Panelists: -Abhijit Chatterjee, Georgia Tech University -Bill Bottoms,3MTS -Mohamed Hafed, Introspect Technology -Steve Wigley, LTX-Credence -Octavio Martinez, Qualcomm

6:00pm-7:00pm		Networking Social hour

July 11, 2013

7:30am-8:00am		Registratioon

8:00am-9:30am		Session 1:Faster Time to Market with Lower Product Costs? Session Chair: Stacy Ajouri, Texas Instruments

8:00am-8:30am		*Minimizing Cost of Calibration and Test (COCT) to drive cost reduction of MEMS* James Quinn, Multitest

8:30am-9:00am		*Escape Prevention and RMA Management* Dan Glotter,Optimal Test

9:00am-9:30am		*Cell-Aware-Test, a Must Have for Leading Technology Nodes* M. Keim*, F. Hapke, W. Redemund, A. Glowatz, J.Rajski, Mentor Graphics M. Reese, J. Rivers, A. Over, V. Ravikumar, J. Rearick, AMD

9:30am-9:45am		Break

9:45am-10:45AM		Session 2:Test Program Game Changers? Session Chair: Paul Berndt, Cypress Semiconductor

9:45am-10:15am		*Automatic Test Program Generation of Analog Trim* Tony Lendino, Texas Instruments

10:15am-10:45am		*New Approaches in ATE Binning* Patrick Conreaux, AMD

10:45am-11:00am		Break

11:00am-11:45am		*LED Lighting – Opportunity, Challenges, & The Future* Sri Jandhyala, Strategic Marketing Director – Lighting Segment ,ON Semiconductor

11:45am-12:45pm		Networking Lunch

12:45pm-1:45pm		Session 3: Economical High Speed Test? Session Chair: Rick Marshall, OptimalTest

12:45pm-1:15pm		*Leveraging Functional FPGAs for Board and System Test* Al Crouch, Asset Intertech; Ajay Khoche, Khoche Consulting

1:15pm-1:45pm		*True HVM RF Testing Beyond 20 GHz* Mark Roos (ROOS Instruments)

1:45pm-2:00pm		Break

2:00pm-3:00pm		SESSION 4: Is this the Future? Session Chair: Ken Lanier, Teradyne

2:00pm-2:30pm		Will the next generation of test engineers be all software engineers? Roy Chorev, Teradyne

2:30pm-3:00pm		*Xbox Speech Recognition Virtual Engineering Assistance: Vision for Future Software Interface for SoC Test Systems* Keith Schuab. Advantest

3:00 pm-3:15pm		Break

3:15pm-4:30pm		Panel 2: “The Next Big Innovation in Test” Moderator: Roger Barth, Micron Technology Panelists: - Abhijit Chatterjee, Georgia Tech University - Bill Bottoms, 3MTS - Mohamed Hafed, Introspect Technology - Steve Wigley, LTX-Credence - Octavio Martinez, Qualcomm

4:30-4:45		Closing Remarks Ajay Khoche, General Chair

For more information, visit the conference website: Test Vision 2020

Who Should Attend

- Semiconductor Test and Product Engineers/Managers
- Test equipment users and developers
- Analysts

Registration

	By June 7	After June 7
SEMI Member	$240	$295
Non Member	$300	$395

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