For years the industry has checked continuity in order to confirm solid contact to the DUT. While this has proved effective a continuity test provides no real visibility into the actual contact quality as it varies across a device interface.
This presentation starts by exploring the value and limitations of a typical continuity test and then contrasts results from a contact resistance checking test function. The presentation will discuss the measurement technique and show some typical results. In addition the presentation will explore and document the challenges with regard to noise floor to getting good measurement results.
In addition, this presentation will document methods and approach useful to confirm solid DPS connections and methods to reliably turn on the supplies to high-power devices.