Testing into the Future
Tuesday, July 8, 2014
10:30-12:30pm
 
Hosted by: Collaborative Alliance for Semiconductor Test (CAST)
                                                                                         Session Sponsor:
 
The historical barriers between Fab, Assembly and Test are breaking down as new technologies are adopted.  The ITRS Test Roadmap identifies these technologies and CAST activities are directed towards pre-competitive solutions to enable them.  This session will start with updates on the ITRS and CAST activities which will lead into a panel session that will discuss the business implications and opportunities.

 

 

Agenda
 
10:30am—11:00am   Dave Armstrong photo

Testing Challenges as Predicted by the ITRS

 

Presentation in pdf

 
Dave Armstrong (Biography)

Director of Business Development

Advantest

 

    
11:00am—11:30am Mark Roos photo  

CAST Activities Update

 

Presentation in PDF

Mark Roos (Biography)

CEO

Roos Instruments

 

11:30am—12:30pm

Panel: “Seeking Growth”

 

The Test & Packaging industry segment is in the middle of unprecedented change.  Technology is being driven by adoption of Increased Integration, Advanced Packaging, and Adaptive Test.  However, over the last decade, these sectors have not experienced the same growth rates that their customers have enjoyed.   This panel will explore the current business and technology trends, asking CEOs about their growth strategies in challenging markets, touching on topics that include further consolidation, product diversification and new technologies to give increased value to their customers and shareholders

 

Moderator:

Ron Leckie, INFRASTRUCTURE Advisors (Biography)

 

Presentation in PDF


 

Panelists


Mark Jagiela photo

Mark Jagiela (Biography)

CEO

Teradyne

 


David Tacelli photo

Dave Tacelli (Biography)

CEO

Xcerra Corporation

 

Tom St. Dennis photo

Tom St Dennis (Biography)

CEO

FormFactor

 
Paul McLaughlin photo  

Paul McLaughlin (Biography)

CEO

Rudolph Technologies

 

How to Register for this Program

 

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