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Test in Transition: Emerging Test and Solutions and Technologies
 
Wednesday, July 13
2:00pm-4:30pm
NorthTwo TechXPOT
Hosted by the SEMI Collaborative Alliance for Semiconductor Test (CAST)
     
Description New Test Solutions, Methodologies and Products are often the enabling technologies behind the next wave of semiconductor products powering the latest consumer products and advanced electronics applications. New test technologies can help achieve faster time to market, to yield and to profit. This session of Test in Transition will introduce the latest innovations and developments in test technology.

Presentations will cover innovative technologies and solutions in test including the latest developments adaptive test, RF test, probe technology and other subjects.
   

 

Agenda  

 

2:00pm-2:30pm  

New Test System Architecture Improves Test Methodologies

Presentation in PDF

A.T Sivaram (Biography)

Product Engineer

Advantest

     
2:30pm-3:00pm  

"Trends in RF Test"
 Presentation in PDF

Greg Smith (Biography)

Broadband and Computing Business Unit Manager, Teradyne

     
3:00pm-3:30pm  

"Key Parameters in Wafer Test Probes’ Current-Carrying Capability"
 Presentation in PDF

Mike Slessor, Ph.D. (Biography)

President and Chief Executive Officer

MicroProbe

     
3:30pm-4:00pm  

"Statistical Post Processing & Adaptive Testing:
A Case Study in Improving Yield by Rejecting more Parts"

 Presentation in PDF

Wesley Smith (Biography)

Director, Applications Engineering & Customer Support

Galaxy Semiconductor

     
4:00pm-4:30pm  

"High-efficient & accurate DC Measurements on Next-generation Digital Cards"
 Presentation in PDF

Stefan Walther (Biography)
Staff Consultant, Semiconductor Test Solutions (STS)
Verigy

     
Session Moderator: Ron Leckie, INFRASTRUCTURE Advisors
     
   
     

 

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