|Description||New Test Solutions, Methodologies and Products are often the enabling technologies behind the next wave of semiconductor products powering the latest consumer products and advanced electronics applications. New test technologies can help achieve faster time to market, to yield and to profit. This session of Test in Transition will introduce the latest innovations and developments in test technology.
Presentations will cover innovative technologies and solutions in test including the latest developments adaptive test, RF test, probe technology and other subjects.
A.T Sivaram (Biography)
Greg Smith (Biography)
Broadband and Computing Business Unit Manager, Teradyne
Mike Slessor, Ph.D. (Biography)
President and Chief Executive Officer
Wesley Smith (Biography)
Director, Applications Engineering & Customer Support
Stefan Walther (Biography)
|Session Moderator:||Ron Leckie, INFRASTRUCTURE Advisors|