Test
The increasing complexity of microelectronic devices has significant implications for test technologies, challenges made even more complex with the added pressures of economic uncertainty and customer's demands for lower costs and higher productivity. Innovations in test technologies, including automated test equipment (ATE), as well as device design (i.e.; design-for-test) are promising to address these challenges, but only with continued research, development, and support across the entire microelectronics supply chain. Technical sessions and presentations at SEMICON West 2010 will explore the issues and solutions taking test from the "back-end" to the forefront.
Test Technical Sessions and Events at SEMICON West 2010
10:30am–12:30pm |
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10:00am–4:00pm |
Collaborative Alliance for Semiconductor Test (CAST) Meeting |
10:30am–12:30pm |
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9:00am–5:00pm
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3rd IEEE International Workshop on Automated Test Equipment: ATEVision 2020 |
Exhibiting Opportunities Available for Test
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Companies with innovative technologies and solutions for test are invited to exhibit at SEMICON West. Great opportunities are still available – learn more about exhibiting at SEMICON West! |
