SEGMENTS

Test


Reducing test costs while maintaining high test quality continue to be the dominant objective of testing complex chips. Current test strategies place an increasing focus on timing correctness, test parallelism, test compression, and adaptive test.  New emerging test methods include further development of adaptive test and wafer-level for speed testing solutions, in addition to new techniques, such as advanced embedded instruments, post-silicon validation, in-system testing, and built-in fault tolerance. Testing of 3D stacked devices also will require new test paradigms and considerable development prior to widespread adoption.

These and other developments, strategies, and solutions will be addressed at SEMICON West  in exhibits from the world's leading test companies and on the show floor at the TechXPOT technical sessions organized by the Collaborative Alliance on Semiconductor Test (CAST).


This year, once again the Test Vision 2020 workshop will be held in conjunction with SEMICON West. It will examine where the test industry is heading and provide a forum for discussing the direction and solutions for emerging problems.


Test Vision 2020 has emerged as the premier workshop in the area of Automated Test Equipment.  Attracting a record attendance from a broad cross-section of the semiconductor community, the workshop features a compelling line-up of papers, keynotes and panel participation from leaders in the industry.

 
Programs and Events on Test

Exhibiting Opportunities Available for Test

Companies with innovative technologies and solutions for test are invited to exhibit at SEMICON West. Great opportunities are still available – learn more about exhibiting at SEMICON West!

Sponsorship opportunities available

Looking for additional visibility and brand exposure with your customers at SEMICON West? Consider one of our many exciting sponsorship opportunities! For more information, contact Marlene Sibley at msibley@semi.org.



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